Nitric acid ≥70%, CMOS for microelectronic, J.T.Baker®
Supplier: Avantor
Ratings:
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Total Ratings: 0
Avg. Ratings: 0.0 out of 5
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Danger
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Synonyms:
Nitric acid solution
9606-03EA
172
GBP
9606-R
9606-03
9606-33
Nitric acid ≥70%, CMOS for microelectronic, J.T.Baker®
Nitric acid
Formula:
HNO₃ MW: 63.01 g/mol Storage Temperature: Ambient |
MDL Number:
MFCD00011349 EINECS: 231-714-2 UN: 2031 ADR: 8,I |
Specification Test Results
Assay (HNO₃} | 69.0 - 70.0 % |
Appearance Passes Test | Passes Test |
Color (APHA) | ≤10 |
Residue after Ignition | ≤2 ppm |
Chloride (Cl) | ≤0.08 ppm |
Phosphate (PO₄) | ≤0.1 ppm |
Sulfate (SO₄) | ≤0.2 ppm |
Trace Impurities - Aluminum (Al) | ≤40.0 ppb |
Arsenic and Antimony (as As) | ≤5 ppb |
Trace Impurities - Barium (Ba) | ≤10.0 ppb |
Trace Impurities - Beryllium (Be) | ≤10.0 ppb |
Trace Impurities - Bismuth (Bi) | ≤20.0 ppb |
Trace Impurities - Boron (B) | ≤10.0 ppb |
Trace Impurities - Cadmium (Cd) | ≤50.0 ppb |
Trace Impurities - Calcium (Ca) | ≤50.0 ppb |
Trace Impurities - Chromium (Cr) | ≤30.0 ppb |
Trace Impurities - Cobalt (Co) | ≤10.0 ppb |
Trace Impurities - Copper (Cu) | ≤10.0 ppb |
Trace Impurities - Gallium (Ga) | ≤10.0 ppb |
Trace Impurities - Germanium (Ge) | ≤20.0 ppb |
Trace Impurities - Gold (Au) | ≤20.0 ppb |
Heavy Metals (as Pb) | ≤100 ppb |
Trace Impurities - Iron (Fe) | ≤40.0 ppb |
Trace Impurities - Lead (Pb) | ≤20.0 ppb |
Trace Impurities - Lithium (Li) | ≤10.0 ppb |
Trace Impurities - Magnesium (Mg) | ≤20.0 ppb |
Trace Impurities - Manganese (Mn) | ≤10.0 ppb |
Trace Impurities - Nickel (Ni) | |
Trace Impurities - Niobium (Nb) | |
Trace Impurities - Potassium (K) | ≤50.0 ppb |
Trace Impurities - Silicon (Si) | ≤50.0 ppb |
Trace Impurities - Silver (Ag) | ≤20.0 ppb |
Trace Impurities - Sodium (Na) | ≤150.0 ppb |
Trace Impurities - Strontium (Sr) | ≤30.0 ppb |
Trace Impurities - Tantalum (Ta) | ≤10.0 ppb |
Trace Impurities - Thallium (Tl) | ≤10.0 ppb |
Trace Impurities - Tin (Sn) | ≤20.0 ppb |
Trace Impurities - Titanium (Ti) | ≤10.0 ppb |
Trace Impurities - Vanadium (V) | ≤10.0 ppb |
Trace Impurities - Zinc (Zn) | ≤20.0 ppb |
Trace Impurities - Zirconium (Zr) | ≤10.0 ppb |
Particle Count - 0.5 µm and greater | ≤60 par/ml |
Particle Count - 1.0 µm and greater | ≤10 par/ml |
For Microelectronic Use | |
Storage Note: Do not store near Ammonium Hydroxide. White crystals may form around the opening. The crystals can be removed with deionized water. This will not affect the quality of the product in the bottle. |
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