Tetrachloroethylene, CMOS for microelectronic, J.T.Baker®
Supplier: Avantor
Ratings:
(No Reviews)
Total Ratings: 0
Avg. Ratings: 0.0 out of 5
Synonyms:
Tetrachloroethene
, PCE
, Ethylene tetrachloride
, Perchloroethylene
Management of Change (MOC) category = R
9453-03EA
0
GBP
9453-03
Tetrachloroethylene, CMOS for microelectronic, J.T.Baker®
Tetrachloroethylene
Formula:
C₂Cl₄ MW: 165.83 g/mol |
MDL Number:
MFCD00000834 CAS Number: 127-18-4 UN: 1897 ADR: 6.1,III |
Specification Test Results
For Microelectronic Use | |
Assay (Cl₂C:CCl₂) (by GC) | ≥ 99.0 % |
Color (APHA) | ≤ 10 |
Residue after Evaporation | ≤ 5 ppm |
Acidity (meq/g) | ≤ 0.0006 |
Water (H₂O)(by Karl Fischer titrn) | ≤ 0.05 % |
Heavy Metals (as Pb) | ≤ 0.20 ppm |
Chloride (Cl) | ≤ 1.0 ppm |
Phosphate (PO₄) | ≤ 0.1 ppm |
Trace Impurities - Aluminum (Al) | ≤ 1 ppm |
Arsenic and Antimony (as As) | ≤ 0.010 ppm |
Trace Impurities - Barium (Ba) | ≤ 1.000 ppm |
Trace Impurities - Boron (B) | ≤ 0.010 ppm |
Trace Impurities - Cadmium (Cd) | ≤ 1.000 ppm |
Trace Impurities - Calcium (Ca) | ≤ 1 ppm |
Trace Impurities - Chromium (Cr) | ≤ 0.500 ppm |
Trace Impurities - Cobalt (Co) | ≤ 0.100 ppm |
Trace Impurities - Copper (Cu) | ≤ 0.010 ppm |
Trace Impurities - Gallium (Ga) | ≤ 0.050 ppm |
Trace Impurities - Germanium (Ge) | ≤ 1.000 ppm |
Trace Impurities - Gold (Au) | ≤ 0.500 ppm |
Trace Impurities - Iron (Fe) | ≤ 0.1 ppm |
Trace Impurities - Lithium (Li) | ≤ 1.000 ppm |
Trace Impurities - Magnesium (Mg) | ≤ 1.000 ppm |
Trace Impurities - Manganese (Mn) | ≤ 1 ppm |
Trace Impurities - Nickel (Ni) | ≤ 0.010 ppm |
Trace Impurities - Potassium (K) | ≤ 1.000 ppm |
Trace Impurities - Silicon (Si) | ≤ 1.000 ppm |
Trace Impurities - Silver (Ag) | ≤ 0.500 ppm |
Trace Impurities - Sodium (Na) | ≤ 1.000 ppm |
Trace Impurities - Strontium (Sr) | ≤ 1.000 ppm |
Trace Impurities - Tin (Sn) | ≤ 1.000 ppm |
Trace Impurities - Zinc (Zn) | ≤ 1.000 ppm |
Contains approximately 50 ppm of stabilizers. |
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