Tetrachloroethylene, CMOS for microelectronic, J.T.Baker®

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Synonyms: TetrachloroethenePCEEthylene tetrachloridePerchloroethylene

Management of Change (MOC) category = R

9453-03EA 0 GBP
9453-03
Tetrachloroethylene, CMOS for microelectronic, J.T.Baker®
Tetrachloroethylene
Formula: C₂Cl₄
MW: 165.83 g/mol
MDL Number: MFCD00000834
CAS Number: 127-18-4
UN: 1897
ADR: 6.1,III
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Specification Test Results

For Microelectronic Use
Assay (Cl₂C:CCl₂) (by GC) ≥ 99.0 %
Color (APHA) ≤ 10
Residue after Evaporation ≤ 5 ppm
Acidity (meq/g) ≤ 0.0006
Water (H₂O)(by Karl Fischer titrn) ≤ 0.05 %
Heavy Metals (as Pb) ≤ 0.20 ppm
Chloride (Cl) ≤ 1.0 ppm
Phosphate (PO₄) ≤ 0.1 ppm
Trace Impurities - Aluminum (Al) ≤ 1 ppm
Arsenic and Antimony (as As) ≤ 0.010 ppm
Trace Impurities - Barium (Ba) ≤ 1.000 ppm
Trace Impurities - Boron (B) ≤ 0.010 ppm
Trace Impurities - Cadmium (Cd) ≤ 1.000 ppm
Trace Impurities - Calcium (Ca) ≤ 1 ppm
Trace Impurities - Chromium (Cr) ≤ 0.500 ppm
Trace Impurities - Cobalt (Co) ≤ 0.100 ppm
Trace Impurities - Copper (Cu) ≤ 0.010 ppm
Trace Impurities - Gallium (Ga) ≤ 0.050 ppm
Trace Impurities - Germanium (Ge) ≤ 1.000 ppm
Trace Impurities - Gold (Au) ≤ 0.500 ppm
Trace Impurities - Iron (Fe) ≤ 0.1 ppm
Trace Impurities - Lithium (Li) ≤ 1.000 ppm
Trace Impurities - Magnesium (Mg) ≤ 1.000 ppm
Trace Impurities - Manganese (Mn) ≤ 1 ppm
Trace Impurities - Nickel (Ni) ≤ 0.010 ppm
Trace Impurities - Potassium (K) ≤ 1.000 ppm
Trace Impurities - Silicon (Si) ≤ 1.000 ppm
Trace Impurities - Silver (Ag) ≤ 0.500 ppm
Trace Impurities - Sodium (Na) ≤ 1.000 ppm
Trace Impurities - Strontium (Sr) ≤ 1.000 ppm
Trace Impurities - Tin (Sn) ≤ 1.000 ppm
Trace Impurities - Zinc (Zn) ≤ 1.000 ppm
Contains approximately 50 ppm of stabilizers.

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